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LE25U20AMB
Specifications
Absolute Maximum Ratings
Parameter
Maximum supply voltage
DC voltage (all pins)
Storage temperature
Symbol
VDDmax
VIN/VOUT
Tstg
With respect to VSS
With respect to VSS
Conditions
Ratings
-0.5 to +4.6
-0.5 to VDD+0.5
-55 to +150
unit
V
V
° C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
Operating Conditions
Parameter
Operating supply voltage
Operating ambient temperature
Symbol
VDD
Topr
Conditions
Ratings
2.30 to 3.60
-40 to 85
unit
V
° C
Allowable DC Operating Conditions
Parameter
Read mode operating current
Symbol
ICCR
Conditions
CS=0.1VDD, HOLD=WP=0.9VDD
SI=0.1VDD/0.9VDD, SO=open
operating frequency=30MHz,
min
Ratings
typ
max
6
unit
mA
VDD=VDD max
Write mode operating current
ICCW
VDD=VDD max, tSSE=40ms,
(erase+page program)
tSE=80ms, tCHE=160ms,
15
mA
tPP=5.0ms
CMOS standby current
ISB
CS=HOLD=WP=VDD,
SI=VSS/VDD, SO=open,
VDD=VDD max
50
μ A
Power-down standby current
IDSB
CS=HOLD=WP=VDD,
SI=VSS/VDD, SO=open,
VDD=VDD max
10
μ A
Input leakage current
Output leakage current
ILI
ILO
VIN=VSS to VDD, VDD=VDD max
VIN=VSS to VDD, VDD=VDD max
2
2
μ A
μ A
Input low voltage
Input high voltage
VIL
VIH
VDD=VDD max
VDD=VDD min
-0.3
0.7VDD
0.3VDD
VDD+0.3
V
V
Output low voltage
Output high voltage
VOL
VOH
IOL=100 μ A, VDD=VDD min
IOL=1.6mA, VDD=VDD min
IOH=-100 μ A, VDD=VDD min
VCC-0.2
0.2
0.4
V
V
Power-on Timing
Parameter
Symbol
min
Ratings
max
unit
Time from power-on to read operation
Time from power-on to write operation
Power-down time
Power-down voltage
tPU_READ
tPU_WRITE
tPD
vBOT
100
10
10
0.2
μ s
ms
ms
V
Pin Capacitance at Ta=25 ° C, f=1MHz
Parameter
Symbol
Conditions
Ratings
unit
max
Output pin capacitance
Input pin capacitance
CDQ
CIN
VDQ=0V
VIN=0V
12
6
pF
pF
Note: These parameter values do not represent the results of measurements undertaken for all devices but rather values
for some of the sampled devices.
No.A2097-16/21
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